ICSFS-8: International Conference on Solid Films and SurfacesHAMAKAWA, Yoshihiro; KOMA, Atsushi.Applied surface science. 1997, Vol 113114, issn 0169-4332, 837 p.Conference Proceedings

Application of the ferroelectric materials to ULSI memoriesTARUI, Y; HIRAI, T; TERAMOTO, K et al.Applied surface science. 1997, Vol 113114, pp 656-663, issn 0169-4332Conference Paper

Chemistry and electronic properties of metal contacts on an organic molecular semiconductorHIROSE, Y; WU, C. I; ARISTOV, V et al.Applied surface science. 1997, Vol 113114, pp 291-298, issn 0169-4332Conference Paper

Coupling effect of surface vibration and quantum confinement carriers in porous siliconMATSUMOTO, T; MASUMOTO, Y; NAKASHIMA, S et al.Applied surface science. 1997, Vol 113114, pp 140-144, issn 0169-4332Conference Paper

Determination of nitrogen-radical flux by nitridation of AlWATANABE, S; NOZOYE, H.Applied surface science. 1997, Vol 113114, pp 618-621, issn 0169-4332Conference Paper

Electronic structure of amorphous Si3N4 : experiment and numerical simulationGRITSENKO, V. A; MOROKOV, YU. N; NOVIKOV, YU. N et al.Applied surface science. 1997, Vol 113114, pp 417-421, issn 0169-4332Conference Paper

Fabrication and characterization of epitaxial films of ionic materialsSAIKI, K.Applied surface science. 1997, Vol 113114, pp 9-17, issn 0169-4332Conference Paper

Growth of epitaxial MnSb layers on Si substrates by hot-wall epitaxyTATSUOKA, H; ISAJI, K; KUWABARA, H et al.Applied surface science. 1997, Vol 113114, pp 48-52, issn 0169-4332Conference Paper

Investigation of metal/SiC interface using electron spectroscopy and scanning tunneling microscopyHIRAI, M; MARUMOTO, Y; KUSAKA, M et al.Applied surface science. 1997, Vol 113114, pp 360-363, issn 0169-4332Conference Paper

Optical properties of excimer laser annealed polycrystalline Si by spectroscopic ellipsometryYU, G; SOGA, T; SHAO, C. L et al.Applied surface science. 1997, Vol 113114, pp 489-492, issn 0169-4332Conference Paper

Organic EL cells with high luminous efficiencyWAKIMOTO, T; MURAYAMA, R; NAGAYAMA, K et al.Applied surface science. 1997, Vol 113114, pp 698-704, issn 0169-4332Conference Paper

Photocurrent multiplication in amorphous Si/crystalline Si heterojunctionISHIDA, K; NAKAMURA, S; TOYAMA, T et al.Applied surface science. 1997, Vol 113114, pp 750-753, issn 0169-4332Conference Paper

Photoluminescence and probe effect of Er-doped nanometer-sized Si materialsZHAO, X; KOMURO, S; ISSHIKI, H et al.Applied surface science. 1997, Vol 113114, pp 121-125, issn 0169-4332Conference Paper

Photoreflectance of low-temperature-grown GaAs on Si-δ-doped GaAsLEE, W. C; HSU, T. M; CHYI, J.-I et al.Applied surface science. 1997, Vol 113114, pp 515-518, issn 0169-4332Conference Paper

Porous silicon annealed under mixed hydrogen and argon atmosphereNAKAMURA, T; OMOYA, H; SASAKI, K et al.Applied surface science. 1997, Vol 113114, pp 145-148, issn 0169-4332Conference Paper

Preparation and properties of reactive-sputtered amorphous CN_x filmsTAKADA, N; ARAI, K; NITTA, S et al.Applied surface science. 1997, Vol 113114, pp 274-277, issn 0169-4332Conference Paper

Characterization of dye-doped TiO₂ films prepared by spray-pyrolysisYANAGI, H; OHOKA, Y; HISHIKI, T et al.Applied surface science. 1997, Vol 113114, pp 426-431, issn 0169-4332Conference Paper

Characterization of surface nanostructures by STM light emission spectroscopyUSHIODA, S.Applied surface science. 1997, Vol 113114, pp 335-342, issn 0169-4332Conference Paper

Driving forces of the surface reconstructions : Mo and W(001) surfacesCHUNG, J. W.Applied surface science. 1997, Vol 113114, pp 436-439, issn 0169-4332Conference Paper

Effects of impurities on the properties of amorphous siliconISOMURA, M; KINOSHITA, T; TANAKA, M et al.Applied surface science. 1997, Vol 113114, pp 754-758, issn 0169-4332Conference Paper

Electron-beam-induced deposition of carbonaceous microstructures using scanning electron microscopyMIURA, N; ISHII, H; SHIRAKASHI, J.-I et al.Applied surface science. 1997, Vol 113114, pp 269-273, issn 0169-4332Conference Paper

Epitaxial growth of zirconium dioxide films on sapphire substratesASAOKA, H; KATANO, Y; NODA, K et al.Applied surface science. 1997, Vol 113114, pp 198-201, issn 0169-4332Conference Paper

Morphological stability of Ag-Au multilayer on SiCHEN, C. R; PENG, Y. C; CHEN, L. J et al.Applied surface science. 1997, Vol 113114, pp 768-772, issn 0169-4332Conference Paper

Nitrogen- and ammonia-plasma nitridation of hydrogenated amorphous siliconMASUDA, A; YOSHIMOTO, S; YONEZAWA, Y et al.Applied surface science. 1997, Vol 113114, pp 610-613, issn 0169-4332Conference Paper

Point-on-line coincidence in epitaxial growth of CuPcCl₁₆ on graphiteIRIE, S; HOSHINO, A; KUWAMOTO, K et al.Applied surface science. 1997, Vol 113114, pp 310-315, issn 0169-4332Conference Paper